Leibing, Shi: search on Z-Library

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1

[IEEE 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018) - Paris, France (2018.7.8-2018.7.13)] 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018) - Time Latency of DC Input Path for 3458A Sampling Multimeter

Feng, Jian, Pan, Yang, Sun, Jian, Shi, Leibing, Lai, Lei

Year:

2018

Language:

english

File:

PDF, 221 KB

english, 2018

2

SPIE Proceedings [SPIE Eighth International Symposium on Advanced Optical Manufacturing and Testing Technology (AOMATT2016) - Suzhou, China (Tuesday 26 April 2016)] 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment - Influencing factors and error analysis for specular gloss measurement

Zhang, Yudong, Wu, Fan, Xu, Ming, To, Sandy, Li, Tiecheng, Shi, Leibing, Lai, Lei, Lin, Fangsheng, Yin, Dejin, Xia, Ming, Wu, Limin

Year:

2016

Language:

english

File:

PDF, 4.18 MB

english, 2016

3

[IEEE 2016 Conference on Precision Electromagnetic Measurements (CPEM 2016) - Ottawa, ON, Canada (2016.7.10-2016.7.15)] 2016 Conference on Precision Electromagnetic Measurements (CPEM 2016) - Calibration of electronic transformer with digital output based on synchronous sampling

Pan, Yang, Wang, Yili, Lai, Lei, Shi, Leibing, Huang, Hongtao, Lu, Chunfeng

Year:

2016

Language:

english

File:

PDF, 324 KB

english, 2016

4

Transmit Antenna Selected V-BLAST Systems With Power Allocation

Zhengyan Shi, Leib, H.

Journal:

IEEE Transactions on Vehicular Technology

Year:

2008

Language:

english

File:

PDF, 388 KB

english, 2008

5

SPIE Proceedings [SPIE Applied Optics and Photonics China (AOPC2015) - Beijing, China (Tuesday 5 May 2015)] AOPC 2015: Optical Test, Measurement, and Equipment - Improvement of the performance evaluation for solar simulators

Han, Sen, Ellis, Jonathan D., Guo, Junpeng, Guo, Yongcai, Li, Tiecheng, Shi, Leibing, Xia, Ming, Yin, Dejin, Lin, Fangsheng, Huang, Biyong

Year:

2015

Language:

english

File:

PDF, 278 KB

english, 2015

6

[IEEE 2016 Conference on Precision Electromagnetic Measurements (CPEM 2016) - Ottawa, ON, Canada (2016.7.10-2016.7.15)] 2016 Conference on Precision Electromagnetic Measurements (CPEM 2016) - A proposal to establish a system for calibration of harmonic power analyzers

Zuliang, Lu, Lei, Wang, Hongtao, Huang, Min, Li, Lijuan, Liu, Zhongwen, Zhu, Shaoyuan, Zhou, Leibing, Shi, Jian, Feng, So, Eddy

Year:

2016

Language:

english

File:

PDF, 150 KB

english, 2016

7

[IEEE 2014 Conference on Precision Electromagnetic Measurements (CPEM 2014) - Rio de Janeiro, Brazil (2014.8.24-2014.8.29)] 29th Conference on Precision Electromagnetic Measurements (CPEM 2014) - Two calibration methods for inductive voltage divider

Feng, Jian, Lai, Lei, Shi, Leibing, Pan, Yang

Year:

2014

Language:

english

File:

PDF, 306 KB

english, 2014

8

[IEEE 2016 Conference on Precision Electromagnetic Measurements (CPEM 2016) - Ottawa, ON, Canada (2016.7.10-2016.7.15)] 2016 Conference on Precision Electromagnetic Measurements (CPEM 2016) - Design and self-calibration of cascaded inductive voltage divider with ratio of 2 n :1

Zhang, Jiangtao, Pan, Xianlin, Shi, Zhaomin, Liu, Wenfang, Feng, Jian, Shi, Leibing, Lai, Lei

Year:

2016

Language:

english

File:

PDF, 290 KB

english, 2016

9

Quasi-Balance Four-Terminal Resistance Bridge

Lai, Lei, Feng, Jian, Shi, Leibing

Journal:

IEEE Transactions on Instrumentation and Measurement

Year:

2015

Language:

english

File:

PDF, 1.32 MB

english, 2015

10

SPIE Proceedings [SPIE Applied Optics and Photonics China (AOPC2015) - Beijing, China (Tuesday 5 May 2015)] AOPC 2015: Optical Test, Measurement, and Equipment - Accuracy of spectral response measurement for large area solar cells using filter method

Han, Sen, Ellis, Jonathan D., Guo, Junpeng, Guo, Yongcai, Li, Tiecheng, Shi, Leibing, Xia, Ming, Yin, Dejin, Lin, Fangsheng, Huang, Biyong

Year:

2015

Language:

english

File:

PDF, 213 KB

english, 2015

11

SPIE Proceedings [SPIE International Symposium on Optoelectronic Technology and Application 2016 - Beijing, China (Monday 9 May 2016)] Optical Measurement Technology and Instrumentation - Accuracy of a reference instrument for specular gloss measurements

Li, Tiecheng, Han, Sen, Tan, JiuBin, Lai, Lei, Shi, Leibing, Yin, Dejin, Lin, Fangsheng, Xia, Ming, Cheng, Weihai

Year:

2016

Language:

english

File:

PDF, 207 KB

english, 2016

12

[IEEE 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018) - Paris, France (2018.7.8-2018.7.13)] 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018) - Calibration of Electronic Transformer Tester Using Digital Sampling Method

Pan, Yang, Shi, Leibing, Feng, Jian, Zhou, Liren, Sun, Weibin, Li, Ruoshi, Zhang, Minghui

Year:

2018

Language:

english

File:

PDF, 209 KB

english, 2018

13

[IEEE 2016 Conference on Precision Electromagnetic Measurements (CPEM 2016) - Ottawa, ON, Canada (2016.7.10-2016.7.15)] 2016 Conference on Precision Electromagnetic Measurements (CPEM 2016) - Phase shift correction of reference sampling multimeter for electronic transformer calibration

Pan, Yang, Lai, Lei, Shi, Leibing, Wang, Yili, Lu, Chunfeng, Qin, Yi

Year:

2016

Language:

english

File:

PDF, 206 KB

english, 2016

14

[IEEE 2014 Conference on Precision Electromagnetic Measurements (CPEM 2014) - Rio de Janeiro, Brazil (2014.8.24-2014.8.29)] 29th Conference on Precision Electromagnetic Measurements (CPEM 2014) - Quasi-balance resistance bridge

Lai, Lei, Feng, Jian, Shi, Leibing

Year:

2014

Language:

english

File:

PDF, 253 KB

english, 2014

15

Development of 300-kV Air-Insulation Standard Impulse Measurement System

Pan, Yang, Shao, Haiming, Xiao, Dengming, Lai, Lei, Shi, Leibing, Zhou, Liren, Zhao, Wei

Journal:

IEEE Transactions on Instrumentation and Measurement

Year:

2015

Language:

english

File:

PDF, 2.54 MB

english, 2015

16

[IEEE 2014 Conference on Precision Electromagnetic Measurements (CPEM 2014) - Rio de Janeiro, Brazil (2014.8.24-2014.8.29)] 29th Conference on Precision Electromagnetic Measurements (CPEM 2014) - Linearity calibration of wideband digitizer using binary inductive voltage divider

Feng, Jian, Shi, Leibing, Qin, Yi, Xu, Feng

Year:

2014

Language:

english

File:

PDF, 328 KB

english, 2014

17

[IEEE 2016 Conference on Precision Electromagnetic Measurements (CPEM 2016) - Ottawa, ON, Canada (2016.7.10-2016.7.15)] 2016 Conference on Precision Electromagnetic Measurements (CPEM 2016) - Measurement of the time constant of four-terminal resistor based on dissipation factor of capacitor

Lai, Lei, Feng, Jian, Shi, Leibing, Shi, Hong, Pan, Yang, Zhou, Bihong

Year:

2016

Language:

english

File:

PDF, 711 KB

english, 2016

18

[IEEE 2014 Conference on Precision Electromagnetic Measurements (CPEM 2014) - Rio de Janeiro, Brazil (2014.8.24-2014.8.29)] 29th Conference on Precision Electromagnetic Measurements (CPEM 2014) - Influence of sample aperture on evaluating harmonics of periodic signals using sampling method

Shi, Leibing, Feng, Jian, Zhou, Bihong, Lai, Lei

Year:

2014

Language:

english

File:

PDF, 260 KB

english, 2014

19

[IEEE 2016 Conference on Precision Electromagnetic Measurements (CPEM 2016) - Ottawa, ON, Canada (2016.7.10-2016.7.15)] 2016 Conference on Precision Electromagnetic Measurements (CPEM 2016) - Calibration of 90° phase difference measured by digital sampling method

Feng, Jian, Shi, Leibing, Xu, Feng, Pan, Yang, Pan, Xianlin, Zhang, Jiangtao

Year:

2016

Language:

english

File:

PDF, 183 KB

english, 2016

20

A reference instrument for specular gloss measurements

Li, Tiecheng, Yin, Dejin, Lin, Fangsheng, Ji, Muyao, Shi, Leibing, Lei, Lai

Journal:

Journal of Physics Conference Series

Year:

2018

Language:

english

File:

PDF, 347 KB

english, 2018

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